Scan test application through high-speed serial in

专利名称：Scan test application through high-speed

serial input/outputs

发明人：Janusz Rajski,Nilanjan Mukherjee,Mark A

Kassab,Thomas H. Rinderknecht,MohamedDessouky

申请号：US12506250申请日：20090720公开号：US08726112B2公开日：20140513

专利附图：

摘要：Methods and devices for using high-speed serial links for scan testing are

disclosed. The methods can work with any scheme of scan data compression or withuncompressed scan testing. The protocol and hardware to support high speed datatransfer reside on both the tester and the device under test. Control data may betransferred along with scan data or be partially generated on chip. Clock signals fortesting may be generated on chip as well. In various implementations, the SerDes(Serializer/Deserializer) may be shared with other applications. The Aurora Protocol maybe used to transport industry standard protocols. To compensate for effects ofasynchronous operation of a conventional high-speed serial link, buffers may be used.The high-speed serial interface may use a data conversion block to drive test cores.

申请人：Janusz Rajski,Nilanjan Mukherjee,Mark A Kassab,Thomas H.Rinderknecht,Mohamed Dessouky

地址：West Linn OR US,Wilsonville OR US,Wilsonville OR US,Tualatin OR US,El-RehabEG

国籍：US,US,US,US,EG

代理机构：Klarquist Sparkman, LLP

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