专利名称:METHODS OF FORMING CAPACITORS发明人:Garo J. Derderian,Kevin R. Shea申请号:US1081申请日:20040720
公开号:US20060019461A1公开日:20060126
专利附图:
摘要:This invention includes methods of forming capacitors. In one implementation, afirst capacitor electrode material is formed over a substrate. The first capacitor electrodematerial is exposed to a nitrogen comprising atmosphere effective to form a dielectricsilicon and nitrogen comprising material on the first capacitor electrode material. The
dielectric silicon and nitrogen comprising material is exposed to an aqueous fluidcomprising a base and an oxidizer. The aqueous fluid has a pH greater than 7.0. After theexposing to the aqueous fluid, an aluminum oxide comprising capacitor dielectric materialis deposited over the first capacitor electrode material. A second capacitor electrodematerial is formed over the aluminum oxide comprising capacitor dielectric material.Other aspects and implementations are contemplated.
申请人:Garo J. Derderian,Kevin R. Shea
地址:Boise ID US,Boise ID US
国籍:US,US
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