METHODS AND SYSTEMS FOR SEMICONDUCTOR TESTING USIN

专利名称：METHODS AND SYSTEMS FOR

SEMICONDUCTOR TESTING USING ATESTING SCENARIO LANGUAGE

发明人：BALOG, Gil申请号：EP07736133.5申请日：20070327公开号：EP2008228A2公开日：20081231

摘要：Methods and systems for semiconductor testing. In one embodiment, asemiconductor testing method includes one or more of the following stages: defining arule relating to semiconductor testing, validating the rule, bundling the rule with otherrules, correlating the rule with other rules, publishing the rule, actualizing the rule, andfollow up relating to the rule. In one embodiment, a semiconductor testing systemincludes one or more of the following modules: rule creation module(s), analysismodule(s), simulation module(s), real time production module(s), and offline productionmodule(s). In one embodiment, user friendly graphical user interface(s) can be used fordefining the building blocks of a rule and/or for viewing an optional hierarchy ofcategories to which the rule belongs.

申请人：Optimaltest Ltd.

地址：18 Einstein St. 74140 Nes-Zionna IL

国籍：IL

代理机构：Fleuchaus, Michael A.

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